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Abstracts Accepted (Current Count: 4)

Paper No. Title

NanoMeasurement2009-1705  

Photoluminescence, Photoconductivity, Gated-Electrical and Nanomechanical Measurements of Individual GaN Nanowires

NanoMeasurement2009-1706  

Electrical Testing as a Probe of Deformation and Voiding in Micro- and Nanoscale Materials and Structures

NanoMeasurement2009-1707  

An EM Nano-Microscope (EMNaM)

NanoMeasurement2009-1708  

A SuFET Based Measuring Neurotransducer


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