Abstracts Accepted
(Current Count: 28)
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| Paper No.
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Title
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IPACK2005-73014
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Failure Site Transition During Drop Testing of Printed Wiring Assemblies
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IPACK2005-73020
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Development of Integrated Process-ageing Modeling Methodology for Flip Chip on Flex Interconnections with Non-conductive Adhesives
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IPACK2005-73045
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Solder Joint Reliability Improvement Using the Cold Ball Pull Metrology
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IPACK2005-73062
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Simulation of Warpage Considering Both Thermal and Cure Induced Shrinkage During Molding in IC Packaging
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IPACK2005-73079
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Novel cyanide free electroless Au plating for the reliable joint between Ni-P/Au and Sn-Ag-Cu based lead free solder
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IPACK2005-73161
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The Bondabilities of Various Metals Using AG Metallo-Organic Nanoparticles and These Bonding Mechanisms
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IPACK2005-73164
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The sintering process of Ag metallo-organic nanoparticles and the influence of the joining parameters upon Cu-to-Cu joining
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IPACK2005-73167
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Effects of Interfacial Microstructure on Strength of Solder Joint using Sn-Ag-Bi-In Solder
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IPACK2005-73209
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Characterization of Thermal Stress Phenomena Induced Into a Packaged Planar Lightwave Circuit Using Fiber Bragg Grating Sensors
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IPACK2005-73249
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Structural Analysis of Microelectronic and Photonic Packaging Systems
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IPACK2005-73253
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Wafer Level Package Challenges: Fabrication Methodology, Packaging Infrastructure and Die-Shrink Considerations
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IPACK2005-73257
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Deformation and Fatigue Fracture of Pb-free Solder Alloys Under Complicated Load Conditions
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IPACK2005-73296
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Novel Test Methods for Die Strength
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IPACK2005-73299
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Fabrication of Sub-micron Silicon Vias by Deep Reactive Ion Etching
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IPACK2005-73301
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Use of Array Capacitors to Improve the Power Delivery Performance of a Microprocessor System
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IPACK2005-73304
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Mechanical Modeling of a Solder Thermal Interface Material: Implications for Thermo-Mechanical Reliability
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IPACK2005-73306
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On Measurement of Effective Silicon Backend Strength Using Bump Pull/Shear Techniques
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IPACK2005-73320
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An Overview of System in Package (SiP) Applications and Technologies for CPU and Communications Systems
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IPACK2005-73321
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HP’s mx2 Processor Module: Twice the Processors in Half the Volume
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IPACK2005-73328
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Analytical and Experimental Characterization of Bonding Over Active Circuitry
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IPACK2005-73329
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Chip Scale Package for Image Sensor Device
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IPACK2005-73339
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Electrical simulation design technology of silicon through substrate
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IPACK2005-73360
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Mechanical Design and Analysis of Land Grid Array (LGA) Sockets
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IPACK2005-73362
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Thermal-Fatigue Life Prediction Equations for Plastic Ball Grid Array (PBGA) SnAgCu Lead-Free Solder Joints
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IPACK2005-73364
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A Systematic Approach for Determining the Thermal Fatigue-Life of Plastic Ball Grid Array (PBGA) Lead-Free Solder Joints
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IPACK2005-73371
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A Paradigm Shift in the Development of Chemical Mechanical Polishing (CMP): Cost-Effective CMP Planarization in Next Generation Substrate/Package Design and Manufacturing
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IPACK2005-73391
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Dual Die Package Design Strategy and Performance
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IPACK2005-73484
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Characterization of Fine Pitch CSP Solder Joints Under Board-Level Free Fall Drop (BFFD)
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